课程题目：BICTAM Short Course on Insights from Nanomaterials

时间：2015年8月11至13日，每天上午9点至11点半

地点：中科院力学所1号楼小礼堂报告厅

报告人：Christopher L. Muhlstein教授（美国佐治亚理工学院）

参加课程注册地址（不收注册费）：http://www.bictam.org.cn/?p=669

报告摘要：

1.       Insights from nanomaterials: Using ultrahigh strength GaP nanowires to reveal the limitations of Raman-based strain measurements

2.       Insights from nanomaterials: Weakest link analyses and the theoretical strength of Si nanowires

3.       Insights from nanomaterials: How grain structure and film thickness control fatigue crack growth and fracture in ultrathin Pt films

All three lectures would include experimental results and various modeling strategies to better understand how structure and length scale controls deformation and damage accumulation in materials.

报告人简介：

Christopher L. Muhlstein received his B.S. in Materials Science and Engineering from the University of California, Berkeley (1994), a M.S.in Metallurgy from the Georgia Institute of Technology (1996), and his Ph.D. in Materials Science and Engineering from the University of California, Berkeley (2002). Dr. Muhlstein joined the faculty in the School of Materials Science and Engineering at the Georgia Institute of Technology in 2011 after spending 9 years on the faculty at The Pennsylvania State University (2002-2011). Dr. Muhlstein’s research establishes fracture and fatigue mechanisms in bulk and thin film materials. Dr. Muhlstein is a member of Alpha Sigma Mu and Keramos honor societies and an NSF CAREER award recipient.